Time domain reflectometry step to S-parameter conversion

A method and apparatus are provided for calculating s-parameters of a device under test from step waveforms acquired by a time domain network analyzer.

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Bibliographische Detailangaben
Hauptverfasser:	Pupalaikis, Peter J, Doshi, Kaviyesh B, Sureka, Anirudh K
Format:	Patent
Sprache:	eng
Schlagworte:	ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTEDFOR SPECIFIC APPLICATION FIELDS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING TRANSMISSION TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION
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Beschreibung
Zusammenfassung:	A method and apparatus are provided for calculating s-parameters of a device under test from step waveforms acquired by a time domain network analyzer.