Semiconductor device, monitoring system, and lifetime prediction method

The disclosed invention can provide a semiconductor device, a lifetime prediction system, and a lifetime prediction method enabling it to notify a user that a semiconductor device is likely to become faulty, before the semiconductor device becomes faulty. A semiconductor device includes functional units and a lifetime prediction circuit. The lifetime prediction circuit acquires a deterioration degree indicating a degree of how each functional unit deteriorates, using a signal that is output from each functional unit. The lifetime prediction circuit executes processing to make a notification that the semiconductor device is close to its lifetime, if the deterioration degree is more than a first threshold.