Determination of a refractive index of a sample and of a particle size of particles in said samples by means of a dynamic light scattering apparatus

A dynamic light scattering apparatus includes a source configured for irradiating a sample with primary electromagnetic radiation, a detector configured for detecting secondary electromagnetic radiation generated by scattering the primary electromagnetic radiation at the sample, a refraction index d...

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Bibliographische Detailangaben
1. Verfasser: Moitzi, Christian
Format: Patent
Sprache:eng
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Zusammenfassung:A dynamic light scattering apparatus includes a source configured for irradiating a sample with primary electromagnetic radiation, a detector configured for detecting secondary electromagnetic radiation generated by scattering the primary electromagnetic radiation at the sample, a refraction index determination unit including a movable optical element and configured to determine information indicative of a refraction index of the sample based on measurements of the secondary electromagnetic radiation for a plurality of different positions of the movable optical element, and a particle size determining unit configured to determine information indicative of particle size of particles in the sample by analyzing the detected secondary electromagnetic radiation and taking into account the refraction index determined by the refraction index determining unit.