Apparatus and method for testing an automatic control device

A system for testing at least a first automatic control device via a plant model includes: a first subsystem; and a second subsystem which is spatially separated from the first subsystem. The plant model comprises an executable first model code and an executable second model code. The first subsyste...

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Bibliographische Detailangaben
Hauptverfasser:	Himmler, Andreas, Klemm, Matthias
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING ELECTRIC DIGITAL DATA PROCESSING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING
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Beschreibung
Zusammenfassung:	A system for testing at least a first automatic control device via a plant model includes: a first subsystem; and a second subsystem which is spatially separated from the first subsystem. The plant model comprises an executable first model code and an executable second model code. The first subsystem comprises a first time-signal processing component configured to electronically assign a first time signal (Ts1) from a global time source to a first event. The first model code is configured to provide a first calculation result based on the first event. The second subsystem comprises a second time-signal processing component configured to electronically assign a second time signal (Ts2) from the global time source to a second event. The second model code is configured to provide a second calculation result based on the second event.