Methods for the analysis of high resolution melt curve data

The present application provides for various embodiments of methods for the analysis of high resolution melt (HRM) curve data; where statistical assay variations in melt curve data may result from system noise in an analysis system. Such system noise may arise from various sources, such as the therm...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Yang, Chengyong, McFarland, Casey, Cheng, Francis T, Wang, Ying
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The present application provides for various embodiments of methods for the analysis of high resolution melt (HRM) curve data; where statistical assay variations in melt curve data may result from system noise in an analysis system. Such system noise may arise from various sources, such as the thermal non-uniformity of a thermocycler block in a thermal cycler apparatus, a detection system, etc. Additionally, various methods for the analysis of HRM curve data may provide an identification of a sample without the need for a user inputted information.