Systems and methods for testing and characterizing LED lighting devices

Systems and methods for testing and characterizing LED lighting devices

Systems and methods for characterizing solid state lighting devices are provided. In certain examples, systems and methods for measuring various parameters of light emitting diodes (LEDs), characterizing each LED based on the measured parameters and selecting one or more of the characterized LEDs su...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Weeks, Jr., T. Warren, Rector, David John
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
COLORIMETRY
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
SEMICONDUCTOR DEVICES
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Systems and methods for characterizing solid state lighting devices are provided. In certain examples, systems and methods for measuring various parameters of light emitting diodes (LEDs), characterizing each LED based on the measured parameters and selecting one or more of the characterized LEDs such that the emitted light from each of the selected LEDs is mixed with the light from the other selected LEDs to create a desired overall light output are described.