Welded state monitoring system and welded state monitoring method

A welded state monitoring system according to an aspect of the present invention is a welded state monitoring system used for plasma shielded electric resistance welding in which electric resistance welding is performed while irradiating a weld zone of a steel sheet with plasma, and is provided with...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	Hamatani, Hideki, Ueda, Manabu, Karube, Yoshifumi, Tanimoto, Michitoshi, Hasegawa, Noboru, Oosawa, Takashi
Format:	Patent
Sprache:	eng
Schlagworte:	AUXILIARY OPERATIONS USED IN CONNECTION WITH METAL-WORKINGWITHOUT ESSENTIALLY REMOVING MATERIAL CALCULATING CLADDING OR PLATING BY SOLDERING OR WELDING COMPUTING COUNTING CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MACHINE TOOLS MANUFACTURE OF METAL SHEETS, WIRE, RODS, TUBES OR PROFILES,OTHERWISE THAN BY ROLLING MEASURING MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVINGMATERIAL METAL-WORKING NOT OTHERWISE PROVIDED FOR OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PERFORMING OPERATIONS PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION PUNCHING METAL SOLDERING OR UNSOLDERING TESTING TRANSPORTING WELDING WORKING BY LASER BEAM
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Beschreibung
Zusammenfassung:	A welded state monitoring system according to an aspect of the present invention is a welded state monitoring system used for plasma shielded electric resistance welding in which electric resistance welding is performed while irradiating a weld zone of a steel sheet with plasma, and is provided with a plasma irradiation device which irradiates the weld zone with plasma, a first image capturing device which captures an image of the weld zone from above and has an image sensor capable of detecting light having a wavelength of 850 nm or more, a first wavelength region limiting device which limits light incident on the first image capturing device to a wavelength region of 850 nm or more, and an image processing device which subjects the image captured by the first image capturing device to image processing and analyzes the welded state of the weld zone thereby being able to analyze the welded state without being affected by the plasma.