Self-aligned trench isolation in integrated circuits

An A method for fabricating an integrated circuit (IC) comprising a substrate, a first device, a second device, and a trench in the substrate is described herein. The trench is self-aligned between the first and second devices and comprises a first portion filled with a dielectric material and a sec...

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Bibliographische Detailangaben
Hauptverfasser: Lu, Ching-Huang, Ohtsuka, Kenichi, Xue, Lei, Chan, Simon Siu-Sing, Sugino, Rinji
Format: Patent
Sprache:eng
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Zusammenfassung:An A method for fabricating an integrated circuit (IC) comprising a substrate, a first device, a second device, and a trench in the substrate is described herein. The trench is self-aligned between the first and second devices and comprises a first portion filled with a dielectric material and a second portion filled with a conductive material. The self-aligned placement of the trench provides electrical isolation between the first and second devices and allows for higher packing density without negatively affecting the operation of closely spaced devices in a high density IC.