Manufacturing method of semiconductor device

In order to provide a semiconductor device with high reliability while manufacturing cost is being suppressed, dry etching for an insulating film is performed by using mixed gas containing at least CF4 gas and C3H2F4 gas as its components.

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Bibliographische Detailangaben
Hauptverfasser: Hanawa, Toshikazu, Kikuchi, Yuji, Akaishi, Masatoshi, Horikoshi, Kotaro
Format: Patent
Sprache:eng
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Zusammenfassung:In order to provide a semiconductor device with high reliability while manufacturing cost is being suppressed, dry etching for an insulating film is performed by using mixed gas containing at least CF4 gas and C3H2F4 gas as its components.