Imprint apparatus and imprint method

An imprint apparatus according to one embodiment includes a contact processing unit and a defect determination unit. The contact processing unit brings a template pattern formed on a front surface of a template into contact with resist placed on a substrate. The defect determination unit determines...

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Bibliographische Detailangaben
Hauptverfasser: Hiroshima, Masahito, Nomura, Hiroshi, Matsuoka, Yasuo
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:An imprint apparatus according to one embodiment includes a contact processing unit and a defect determination unit. The contact processing unit brings a template pattern formed on a front surface of a template into contact with resist placed on a substrate. The defect determination unit determines a defect in an imprint process, on the basis of force which is generated from at least one of the template, the resist, and the substrate, during the imprint process.