Enabling testing of an integrated circuit at a single temperature

Enabling testing of an integrated circuit at a single temperature

In one aspect, an integrated circuit (IC) includes an output port enabling measurement of a performance characteristic of the IC at a first temperature. The performance characteristic of the IC is a minimum value at the first temperature with respect to any other temperature. The first temperature m...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Milesi, Alejandro G, Tran, Sam, Moody, Kristann L
Format: Patent
Sprache:eng
Schlagworte:
COLORIMETRY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
RADIATION PYROMETRY
TESTING
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Beschreibung
Zusammenfassung:In one aspect, an integrated circuit (IC) includes an output port enabling measurement of a performance characteristic of the IC at a first temperature. The performance characteristic of the IC is a minimum value at the first temperature with respect to any other temperature. The first temperature may be room temperature.