Radiation measuring apparatus and radiation measuring method

A radiation measuring apparatus (20) includes a scatterer detector (10A), an absorber detector (10B) and a processing unit (12). Pixel electrodes (2) of the scatterer detector (10A) and the absorber detector (10B) are arranged such that a distance between centers of two neighbor pixel electrodes (2)...

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Hauptverfasser: Kosugi, Kazumasa, Gemba, Kei, Takahashi, Tadayuki, Matsuura, Daisuke, Watanabe, Shin, Takeda, Shin'ichiro, Yamamoto, Hiroo, Yamamura, Kazuhisa, Kuroda, Yoshikatsu
Format: Patent
Sprache:eng
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Zusammenfassung:A radiation measuring apparatus (20) includes a scatterer detector (10A), an absorber detector (10B) and a processing unit (12). Pixel electrodes (2) of the scatterer detector (10A) and the absorber detector (10B) are arranged such that a distance between centers of two neighbor pixel electrodes (2) is smaller than a mean free path of a recoil electron generated in the Compton scattering of an electromagnetic radiation. The processing unit (12) specifies and incidence direction of the electromagnetic radiation based on a recoiling direction to which the recoil electron recoils. In this way, an electron tracking-type Compton camera is realized which confines the incidence direction of the electromagnetic radiation by using the recoiling direction of the recoil electron in a Compton camera using a semiconductor detector.