Proximity probe interchange compensation

A system includes a proximity probe. The system also includes a probe information element. The probe information element is coupled to the proximity probe. The probe information element includes first data corresponding to one or more first error characteristics of the proximity probe.

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Bibliographische Detailangaben
1. Verfasser:	Turnbeaugh, Lysle R
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS DETECTING MASSES OR OBJECTS GEOPHYSICS GRAVITATIONAL MEASUREMENTS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING ELECTRIC VARIABLES MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A system includes a proximity probe. The system also includes a probe information element. The probe information element is coupled to the proximity probe. The probe information element includes first data corresponding to one or more first error characteristics of the proximity probe.