V-shape recess profile for embedded source/drain epitaxy

A semiconductor device includes a semiconductor base. A dielectric isolation structure is formed in the semiconductor base. A source/drain of a FinFET transistor is formed on the semiconductor base. A bottom segment of the source/drain is embedded into the semiconductor base. The bottom segment of t...

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Bibliographische Detailangaben
Hauptverfasser: Lin, Tzu-Ching, Lin, Yih-Ann, Chen, Chih-Shan, Li, Chii-Horng, Tai, Roger, Lee, Yen-Ru
Format: Patent
Sprache:eng
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Zusammenfassung:A semiconductor device includes a semiconductor base. A dielectric isolation structure is formed in the semiconductor base. A source/drain of a FinFET transistor is formed on the semiconductor base. A bottom segment of the source/drain is embedded into the semiconductor base. The bottom segment of the source/drain has a V-shaped cross-sectional profile. The bottom segment of the source/drain is separated from the dielectric isolation structure by portions of the semiconductor base.