Wafer-level back-end fabrication systems and methods

Systems and methods may be provided for fabricating infrared focal plane arrays. The methods include providing a device wafer, applying a coating to the device wafer, mounting the device wafer to a first carrier wafer, thinning the device wafer while the device wafer is mounted to the first carrier...

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Bibliographische Detailangaben
Hauptverfasser: Huang, Edward K, Bornfreund, Richard E, Hood, Andrew D, Gall, Bryan, Heu, Paula
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Systems and methods may be provided for fabricating infrared focal plane arrays. The methods include providing a device wafer, applying a coating to the device wafer, mounting the device wafer to a first carrier wafer, thinning the device wafer while the device wafer is mounted to the first carrier wafer, releasing the device wafer from the first carrier wafer, singulating the device wafer into individual dies, each die having an infrared focal plane array, and hybridizing the individual dies to a read out integrated circuit.