Adaptive write fault thresholds
Systems and methods for determining a relationship between write fault threshold and temperature are described. The systems and methods include measuring an operating temperature of the storage device, determining a current operating temperature of the storage device, determining whether the current...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | Systems and methods for determining a relationship between write fault threshold and temperature are described. The systems and methods include measuring an operating temperature of the storage device, determining a current operating temperature of the storage device, determining whether the current operating temperature of the storage device satisfies a temperature threshold, and upon determining the current operating temperature of the storage device satisfies the temperature threshold, modifying a write fault threshold associated with a data track of the storage device. |
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