Semiconductor devices with asymmetric halo implantation and method of manufacture

A method includes forming a hardmask over one or more gate structures. The method further includes forming a photoresist over the hardmask. The method further includes forming an opening in the photoresist over at least one of the gate structures. The method further includes stripping the hardmask t...

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Bibliographische Detailangaben
Hauptverfasser: Rankin, Jed H, Holmes, Eva S, Bhagat, Darshana N, Dunbar, Thomas J, Lim, Yen L
Format: Patent
Sprache:eng
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Zusammenfassung:A method includes forming a hardmask over one or more gate structures. The method further includes forming a photoresist over the hardmask. The method further includes forming an opening in the photoresist over at least one of the gate structures. The method further includes stripping the hardmask that is exposed in the opening and which is over the at least one of the gate structures. The method further includes removing the photoresist. The method further includes providing a halo implant on a side of the least one of the at least one of the gate structures.