METHOD FOR CONTACTLESSLY MEASURING THE DEFORMATION OF A SAMPLE AND A DEVICE FOR THE REALIZATION OF THE METHOD

The proposed method for contactlessly measuring the deformation of a sample consists in installing the sample to be tested at the testing machine, determining the characteristic parameters of the sample, fixing measuring light-emitting elements to the sample, generating optical images of the measuri...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	SKRYPNYCHENKO ANATOLII IVANOVYCH, OBODAN VOLODYMYR YAKOVYCH, MOROZOV PAVLO EDUARDOVYCH, KLYMANCHUK VLADYSLAV VLADYSLAVOVYCH, SYDORENKO ANDRII IVANOVYCH
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The proposed method for contactlessly measuring the deformation of a sample consists in installing the sample to be tested at the testing machine, determining the characteristic parameters of the sample, fixing measuring light-emitting elements to the sample, generating optical images of the measuring light-emitting elements on the light-sensitive surface of a photodetector, converting the images so produced into electric signals, and processing the said signals. The proposed method differs by installing an additional light-emitting element along the longitudinal axis of the sample, with the specified fixed distances between the additional light-emitting element and the measuring light-emitting elements, and determining scaling transform coefficients for the optical images by using the said distances. The present invention relates also toa device for the realization of the proposed method.