Apparatus for diagnostics of reliability of semiconductor super-powerful pulse avalanche-transit diodes (ATD)

Apparatus for diagnostics of reliability of semiconductor super-powerful pulse avalanche-transit diodes (ATD) includes reading device, second coaxial delay line, former of nano-second pulses to which first coaxial delay line is connected. To the first coaxial delay line tee element is connected to w...

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Bibliographische Detailangaben

Hauptverfasser:	Konakova Raisa Vasylivna, Shynkarenko Volodymyr Viktorovych, Kudrik Yaroslav Yaroslavovych, Boltovets Mykola Sylovych, Bieliaiev Oleksandr Yevhenovych
Format:	Patent
Sprache:	eng ; rus ; ukr
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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