Elastic probe and circuit test device

A circuit testing device includes a base, a fixing seat, an elastic probe, and a detection electrode. The base includes a test opening. The fixing base includes a fixing groove. The elastic probe includes a fixed section, a first elastic section, a second elastic section, an extension section, and a contact section in sequence. The fixing section is disposed in the fixing slot and protrudes into the testing slot. The first spring segment is bent in a direction opposite to the test opening. The second elastic segment is bent in the direction of the test opening. The extension extends to the test opening. The contact segment protrudes outwardly from the test opening. The detection electrode is arranged in the base and is electrically connected with the elastic probe. The contact section can supply power to the test electrode of the circuit to be tested and abut and make the test electrode and the test electrode electrically connected.