Probe,probe card and method for manufacturing probe

A probe comprises a first metal part (N) and a plate-shaped second metal part (K). The second metal part (K) is embedded in one end of the first metal part (K) in the longitudinal direction (X) thereof in a predetermined range, protrudes from the first metal part (N) in the longitudinal direction (X...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	MORI, CHIKAOMI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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