Method and apparatus for adapting operation settings for a frequency sweep measurement of a polymer product
Method for adapting operation settings for a frequency sweep measurement of a polymer product, the method comprising the steps of: providing (S1) at least one set of operation setting parameters comprising at least one frequency range for the frequency sweep measurement of the polymer product, the a...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | Method for adapting operation settings for a frequency sweep measurement of a polymer product, the method comprising the steps of: providing (S1) at least one set of operation setting parameters comprising at least one frequency range for the frequency sweep measurement of the polymer product, the at least one frequency range comprising a plurality of specific measurement frequencies; optimizing (S2) the frequency range by deleting at least one measurement frequency of the plurality of specific measurement frequencies within a lower half of the frequency range resulting in a first optimized frequency range; and optimizing (S3) the first optimized frequency range by determining a value of measurement frequencies present per decade of frequency within at least a subrange of the frequency range and reducing the determined value of measurement frequencies present per decade within the at least one subrange of the frequency range by deleting at least one measurement frequency of the at least one subrange resulting |
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