TWI842918B

Provided is a composition that can be used to etch a metal layer, e.g. a copper layer, and that makes it possible to form a fine pattern that has excellent dimensional precision and little cross-sectional narrowing of fine lines while suppressing the generation of a residual film. A composition that...

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Bibliographische Detailangaben
Hauptverfasser: ABE, TETSUJI, NOGUCHI, YUTA
Format: Patent
Sprache:chi
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