Image offset calibration method and image offset calibration system

The invention discloses an image offset correction method and an image offset correction system. The image offset correction method includes the following steps. Obtaining a first image and a second image which are generated when the microscope system shoots the reference pattern under the first fil...

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1. Verfasser: CHANG, YENIEH
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses an image offset correction method and an image offset correction system. The image offset correction method includes the following steps. Obtaining a first image and a second image which are generated when the microscope system shoots the reference pattern under the first filter and the second filter respectively; obtaining a plurality of first contours and a plurality of first center coordinates of the reference pattern in the first image by using an object detection algorithm, and obtaining a plurality of second contours and a plurality of second center coordinates of the reference pattern in the second image by using the object detection algorithm; and calculating a plurality of offsets according to the first center coordinate and the second center coordinate, and performing pixel displacement on the second image according to the offsets to generate a corrected second image.