TRAINING METHOD FOR DEFECT DETECTION MODEL AND DEFECT DETECTION METHOD FOR PRINTED CIRCUIT BOARD

The present disclosure provides a training method for defect detection model and defect detection method for printed circuit board, wherein the training method comprises: acquiring design document information of a printed circuit board, wherein the design document information comprises region inform...

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Bibliographische Detailangaben
Hauptverfasser: KAPLAN, VAL, HU, BINGFENG, TZHORI, AMIR, FLIESWASSER, RONI
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The present disclosure provides a training method for defect detection model and defect detection method for printed circuit board, wherein the training method comprises: acquiring design document information of a printed circuit board, wherein the design document information comprises region information of the printed circuit board; scanning the printed circuit board with a scanning camera device to obtain a scanned image of the printed circuit board; generating learning samples based on the scanned image and region information of the printed circuit board, wherein each learning sample comprises a sample image and a corresponding label, comprising capturing a partial image in the scanned image to obtain a sample image and manually labeling the sample image, wherein the label obtained by manual labeling comprises region information and defect information; establishing a sample library, comprising collecting and storing learning samples generated based on multiple printed circuit boards according to above step