Polishing system, carrier head assembly, and method of polishing a substrate

A polishing system is provided, including a carrier with an offset distance. The offset distance allows a shifted carrier head to cover more surface area of the polishing surface. The offset distance effectively provides an additional rotation of the carrier head about the axis, which allows for a g...

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Bibliographische Detailangaben
Hauptverfasser: ZUNIGA, STEVEN M, GURUSAMY, JAY, KIM, BUM JICK, LOI, DANIELLE
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:A polishing system is provided, including a carrier with an offset distance. The offset distance allows a shifted carrier head to cover more surface area of the polishing surface. The offset distance effectively provides an additional rotation of the carrier head about the axis, which allows for a greater area traversed on the polishing surface, improving chemical mechanical polishing uniformity on the substrate.