Correction system of measuring instrument and correction method of measuring instrument

A correction system of a measuring instrument includes a standard fixture, a probe assembly, and a moving device. The standard fixture includes a plurality of standard components and a printed circuit board. The specifications of every one of the standard components are different, and the plurality...

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Bibliographische Detailangaben
Hauptverfasser:	LEE, SHIN-YE, WU, CHIEN-MING, HUANG, CHIHUNG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A correction system of a measuring instrument includes a standard fixture, a probe assembly, and a moving device. The standard fixture includes a plurality of standard components and a printed circuit board. The specifications of every one of the standard components are different, and the plurality of standard components are disposed on the printed circuit board. The printed circuit board includes a plurality of through holes. One of the through holes is adjacent to one of the standard components. The probe assembly is connected to a measuring instrument. The moving device is connected to the standard fixture, and the moving device is configured to move one of the standard components to be connected to the probe assembly such that the measuring instrument can be tested by the one of the standard components.