Handling apparatus for testing electronic component

The invention discloses a handling apparatus for testing electronic components. In the handling apparatus for testing electronic components of the invention, a loading storage box that is used to store customer trays loaded with a plurality of electronic components to be tested and an unloading stor...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: NA, YUN SUNG, KIM, PYOUNG SEOK
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a handling apparatus for testing electronic components. In the handling apparatus for testing electronic components of the invention, a loading storage box that is used to store customer trays loaded with a plurality of electronic components to be tested and an unloading storage box that is used to store customer trays loaded with a plurality of electronic components that have been tested completely are arranged outside the wall body frame by protruding the front of the wall body frame so that even when one handling machine is responsible for multiple testing machines, the idle time of the handling machine is not required to greatly enhance the processing capacity.