METHOD FOR QUANTITATIVE ANALYSIS OF ELEMENTS

The present invention provides a method for quantitatively analyzing elements within a sample gas such as LA-ICP-MS without using a solid standard sample. The present invention is a method in which a sample gas is introduced into an inductively coupled plasma mass spectrometer and the elements of a...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	KAWABATA, KATSUHIKO, ICHINOSE, TATSUYA, SUZUKI, KOSHI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL ATOMISING APPARATUS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING NOZZLES PERFORMING OPERATIONS PHYSICS SPRAYING APPARATUS SPRAYING OR ATOMISING IN GENERAL TESTING TRANSPORTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	The present invention provides a method for quantitatively analyzing elements within a sample gas such as LA-ICP-MS without using a solid standard sample. The present invention is a method in which a sample gas is introduced into an inductively coupled plasma mass spectrometer and the elements of a solid sample are quantitatively analyzed, wherein the method is characterized in that a standard solution containing specific elements at known concentrations is directly supplied (by standard addition) at a flow rate of 3 μL/min or less, and the concentrations of the elements included in the sample gas generated from the solid sample are thereby measured using a signal strength obtained by introducing the standard solution to a torch section from a solution introduction means.