TWI822968B

TWI822968B

A color filter inspection device (1) is provided with: a defect detection unit (12) that detects defect candidates on the basis of a captured image of a color filter; and a defect output unit (21) that determines whether each defect candidate is a defect by comparing at least one physical quantity o...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: UEHARA, TOSHIAKI, TOTSUKA, TAKAYUKI, OZAKI, YASUTAKA, OKAZAWA, ATSUSHI, KITAGUCHI, TAKASHI
Format: Patent
Sprache:chi
Schlagworte:
BASIC ELECTRIC ELEMENTS
CALCULATING
COMPUTING
COUNTING
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Beschreibung
Zusammenfassung:A color filter inspection device (1) is provided with: a defect detection unit (12) that detects defect candidates on the basis of a captured image of a color filter; and a defect output unit (21) that determines whether each defect candidate is a defect by comparing at least one physical quantity of the detected defect candidate with a threshold of the physical quantity, and outputs defect candidates other than the defect candidates determined as not defects to a neural network for defect classification.