TWI807105B

To recover fragments of a broken chip.SOLUTION: A breaking test device for chips comprises: a chip breakdown unit capable of breaking a chip; and a fragment recovery unit provided below the chip breakdown unit and having a fragment retention surface for retaining fragments of the chip broken by the chip breakdown unit on its front face. The chip breakdown unit breaks the chip so that the original point of breakdown of the broken chip faces the fragment retention surface of the fragment recovery unit. The fragment retention surface of the fragment recovery unit may be along a horizontal plane. The chip breakdown unit includes: a first chip support part having a first face along the vertical direction; and a second chip support part having a second face along the vertical direction facing the first face, and may include a chip pinching unit capable of pinching a chip which is curved in the U shape, and a movement unit for relatively moving the first chip support part and the second chip support part in a direct