Test socket and method of fabricating the same

Test socket and method of fabricating the same

The disclosure relates to a test socket and a method of fabricating a test socket that supports a probe stretchable in a longitudinal direction. The method of fabricating a test socket includes forming a probe hole for accommodating the probe in a base member made of a conductive material, filling t...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: JEONG, JAE-HWAN, KIM, GEUN-SU, BAEK, SEUNGHA, SHIN, JUNGUL
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:The disclosure relates to a test socket and a method of fabricating a test socket that supports a probe stretchable in a longitudinal direction. The method of fabricating a test socket includes forming a probe hole for accommodating the probe in a base member made of a conductive material, filling the probe hole with a resin as an insulating material to a predetermined depth from an upper surface of the base member to form a probe support member; and forming a first support hole for supporting one end portion of the probe in the probe support member in the probe hole to expose the one end portion of the probe.