Selective sidewall spacers

Processing methods may be performed to form semiconductor structures that may include spacer materials on dielectric materials. The methods may include depositing a first dielectric material on a silicon element on a semiconductor substrate. The first dielectric material may be selectively deposited...

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Bibliographische Detailangaben
Hauptverfasser: LEE, GILL YONG, THAREJA, GAURAV
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:Processing methods may be performed to form semiconductor structures that may include spacer materials on dielectric materials. The methods may include depositing a first dielectric material on a silicon element on a semiconductor substrate. The first dielectric material may be selectively deposited on the silicon element relative to exposed regions of a second dielectric material. The methods may also include selectively etching the silicon element from the semiconductor substrate.