Automated handling of different form factor devices under test in test cell

A system for performing tests using automated test equipment (ATE) is disclosed. The system comprises a robot comprising an end effector operable to pick up and transfer a DUT in-and-out of a test slot in a primitive. The system further comprises a system controller comprising a memory and a processor for controlling the robot. Also, the system comprises a test rack comprising a plurality of primitives, wherein the primitive is a modular device comprising a plurality of slots for testing a plurality of DUTs, and wherein the robot is configured to access slots in the plurality of primitives within the test rack using the end effector.