TWI783400B

An error cause estimation device comprises a feature value generation unit for using data transmitted from the outside to generate feature values suitable for a machine learning model; a model database having a plurality of error prediction models, for determining whether an error has occurred using...

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Hauptverfasser: HAYAKAWA, KOUICHI, ISHIKAWA, MASAYOSHI, YOSHIDA, YASUHIRO, TAKANO, MASAMI, SASAJIMA, FUMIHIRO
Format: Patent
Sprache:chi
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Beschreibung
Zusammenfassung:An error cause estimation device comprises a feature value generation unit for using data transmitted from the outside to generate feature values suitable for a machine learning model; a model database having a plurality of error prediction models, for determining whether an error has occurred using the feature values as input data; a model evaluation unit for evaluating the performance of an error prediction model by comparing a prediction result of the error prediction model and an actually measured error; a model selection unit for selecting from the model database an error prediction model for which an evaluation value calculated by the model evaluation unit is greater than or equal to a preset defined value; and an error prediction model generation unit for generating a new error prediction model with respect to the measured error when no corresponding error prediction model has been selected by the model selection unit.