TWI779146B

TWI779146B

To provide a cutting device, capable of measuring simply inclination or irregularities of an end surface of a mount flange having a contact with a cutting blade.SOLUTION: A cutting device 2 includes a chuck table 18 for holding a workpiece 11, a cutting unit 24 for cutting the workpiece with a cutti...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: KOZAI, HIROHIKO
Format: Patent
Sprache:chi
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
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Beschreibung
Zusammenfassung:To provide a cutting device, capable of measuring simply inclination or irregularities of an end surface of a mount flange having a contact with a cutting blade.SOLUTION: A cutting device 2 includes a chuck table 18 for holding a workpiece 11, a cutting unit 24 for cutting the workpiece with a cutting blade fixed to the tip of a spindle through a blade mount, a measuring unit 48 for measuring inclination or irregularities of an annular end surface having a contact with the cutting blade of the blade mount mounted on the spindle, and a notification unit 54 for notifying of a measurement result by the measuring unit 48.SELECTED DRAWING: Figure 1