Defect feature threshold obtaining device, image detection system using the same and method

Defect feature threshold obtaining device, image detection system using the same and method

A defect feature threshold obtaining device includes a clusterer and a defect feature threshold obtaining unit. The clusterer is configured for determining whether a plurality of defect feature values can be divided into a first group and a second group. The defect feature threshold obtaining unit i...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LI, TING-CING, HSU, WEIIH, WU, SHENG-HSIEN, CHEN, CHUNG-YU, LIN, KUAN-HUNG
Format: Patent
Sprache:chi ; eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A defect feature threshold obtaining device includes a clusterer and a defect feature threshold obtaining unit. The clusterer is configured for determining whether a plurality of defect feature values can be divided into a first group and a second group. The defect feature threshold obtaining unit is configured for: when the defect feature values can be divided into the first group and the second group, synthesizing the defect feature values of the first group and the defect feature values of the second group into a synthetic feature curve; and, obtaining a defect feature threshold of the synthetic feature curve.