COMPUTATION APPARATUS AND METHOD OF DETECTING DEFECTS FOR NEAR-EYE DISPLAY

A method for detecting defects in a near-eye display is provided. The method includes the following steps: obtaining a reference image and a DUT image according to a first image and a second image captured by a camera through a Fresnel lens when a display panel respectively displays a test-pattern i...

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Bibliographische Detailangaben
Hauptverfasser:	YANG, WENU, YANG, CHI-HSIEN, LIN, YEH
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY HEALTHCARE INFORMATICS, i.e. INFORMATION AND COMMUNICATIONTECHNOLOGY [ICT] SPECIALLY ADAPTED FOR THE HANDLING ORPROCESSING OF MEDICAL OR HEALTHCARE DATA IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTEDFOR SPECIFIC APPLICATION FIELDS PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION
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Beschreibung
Zusammenfassung:	A method for detecting defects in a near-eye display is provided. The method includes the following steps: obtaining a reference image and a DUT image according to a first image and a second image captured by a camera through a Fresnel lens when a display panel respectively displays a test-pattern image and a test-background image; performing a fast Fourier transform on the reference image and the DUT image to obtain a frequency-domain reference image and a frequency-domain DUT image; calculating an average value of pixel values above a predetermined cut-off ratio in a histogram of each first region of interest (ROI) in a filtered frequency-domain reference image as a corresponding threshold; comparing each pixel in the filtered DUT image with the corresponding threshold to generate a determination result; and building a defective-status map of the near-eye display according to the determination results.