TWI743989B

Provided are a chemical mechanical polishing composition and a chemical mechanical polishing method that can polish a semiconductor substrate containing an electric conductor metal, such as tungsten or cobalt, flat and at high speed, and reduce post-polishing surface defects. The chemical mechanical...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: KAMEI, YASUTAKA, WANG, PENGYU, YAMADA, YUUYA, SUGIE, NORIHIKO
Format: Patent
Sprache:chi
Schlagworte:
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