TWI698645B

To provide a probe assembly capable of flexibly positioning a probe matching an alignment state of inspection terminals.SOLUTION: The present invention comprises: a support member; a probe group in which a plurality of probes each including a first contact part coming into contact with a first conta...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SEINO, YOJI, AKAHIRA, MEGUMI, YAMAGUCHI, HISASHI, SAITOH, TOYOKAZU
Format: Patent
Sprache:chi
Schlagworte:
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Beschreibung
Zusammenfassung:To provide a probe assembly capable of flexibly positioning a probe matching an alignment state of inspection terminals.SOLUTION: The present invention comprises: a support member; a probe group in which a plurality of probes each including a first contact part coming into contact with a first contact object, and a second contact part coming into contact with a second contact object, are aligned along the longitudinal direction of the support member; and a plurality of positioning members supporting the respective probes with their penetrating through central regions of the respective probes of the probe group. The probe group includes: a plurality of first probes each having a fixing hole disposed from the central region toward the first contact part side, and a position adjusting hole disposed from the central region toward the second contact part side; and a plurality of second probes each having a position adjusting hole disposed from the central region toward the first contact part side, and a fixing hol