TWI698645B
To provide a probe assembly capable of flexibly positioning a probe matching an alignment state of inspection terminals.SOLUTION: The present invention comprises: a support member; a probe group in which a plurality of probes each including a first contact part coming into contact with a first conta...
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Format: | Patent |
Sprache: | chi |
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Zusammenfassung: | To provide a probe assembly capable of flexibly positioning a probe matching an alignment state of inspection terminals.SOLUTION: The present invention comprises: a support member; a probe group in which a plurality of probes each including a first contact part coming into contact with a first contact object, and a second contact part coming into contact with a second contact object, are aligned along the longitudinal direction of the support member; and a plurality of positioning members supporting the respective probes with their penetrating through central regions of the respective probes of the probe group. The probe group includes: a plurality of first probes each having a fixing hole disposed from the central region toward the first contact part side, and a position adjusting hole disposed from the central region toward the second contact part side; and a plurality of second probes each having a position adjusting hole disposed from the central region toward the first contact part side, and a fixing hol |
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