SYSTEMS AND METHODS FOR REDUCING BACKSIDE DEPOSITION AND MITIGATING THICKNESS CHANGES AT SUBSTRATE EDGES

A substrate processing system for depositing film on a substrate includes a processing chamber defining a reaction volume and including a substrate support for supporting the substrate. A gas delivery system is configured to introduce process gas into the reaction volume of the processing chamber. A...

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Bibliographische Detailangaben
Hauptverfasser: PASQUALE, FRANK, BARNETT, CODY, VARADARAJAN, SESHA, MINSHALL, TED, LAVOIE, ADRIEN, SANGPLUNG, SAANGRUT, SWAMINATHAN, SHANKAR, SABRI, MOHAMED
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:A substrate processing system for depositing film on a substrate includes a processing chamber defining a reaction volume and including a substrate support for supporting the substrate. A gas delivery system is configured to introduce process gas into the reaction volume of the processing chamber. A plasma generator is configured to selectively generate RF plasma in the reaction volume. A clamping system is configured to clamp the substrate to the substrate support during deposition of the film. A backside purging system is configured to supply a reactant gas to a backside edge of the substrate to purge the backside edge during the deposition of the film.