Optical sectioning apparatus using advanced optical interference microscopy

An optical sectioning apparatus using optical interference microscopy and fluorescence microscopy, including: a beam splitter capable of splitting an incident light beam into a reflected light beam and a transmitted light beam; a wide band light source for providing the incident light beam; a reference arm unit for making the transmitted light beam travel a round trip along an adjustable optical path; a short wavelength light source; a first dichroic splitter, with a first side facing the short wavelength light source and a third side facing the beam splitter, being capable of providing a light-blocking effect on wavelengths shorter than a preset wavelength; an objective lens, with a collimated side facing a second side of the first dichroic splitter; a sample carrier unit facing a focal side of the objective lens; and a projection lens and a sensor units for receiving an output light beam.