WORKPIECE CONDUCTIVE FEATURE INSPECTING METHOD AND WORKPIECE CONDUCTIVE FEATURE INSPECTING SYSTEM

A method for inspecting conductive features of workpiece includes videographing a part of a workpiece disposed with conductive features, to capture a workpiece sub-image, in which the workpiece sub-image has one or more feature images corresponded to one or more conductive features respectively; sub...

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Bibliographische Detailangaben
1. Verfasser:	CHEN, YONGNG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A method for inspecting conductive features of workpiece includes videographing a part of a workpiece disposed with conductive features, to capture a workpiece sub-image, in which the workpiece sub-image has one or more feature images corresponded to one or more conductive features respectively; subsequently, based on a standard workpiece image having predetermined feature points, finding a sub-set of predetermined feature points corresponded with at least part of the feature images among the predetermined feature points, to position an area of the standard workpiece image corresponded to the workpiece sub-image; and then comparing the predetermined feature points within the corresponded area of the standard workpiece with the feature images of the workpiece sub-image, if at least one of the feature images was differed from the predetermined feature points within the corresponded area, the workpiece is then judged as a defect workpiece.