Memory system, memory test system and method of testing memory system and memory test system
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| creator | JOE, IN-SUNG KIM, YOUNG-KUM HA, KYOUNG-HO SONG, KI-JAE SUH, SUNG-DONG CHO, SOO-HAENG KIM, SEONG-GU |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TWI503830BB</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TWI503830BB</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TWI503830BB3</originalsourceid><addsrcrecordid>eNrjZIjxTc3NL6pUKK4sLknN1VHIhXBLUotLoGIKiXkpQOGSjPwUhfw0sExmXjpMIYoadK08DKxpiTnFqbxQmptBwc01xNlDN7UgPz61uCAxOTUvtSQ-JNzT1MDYwtjAycmYCCUAfOE8UQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Memory system, memory test system and method of testing memory system and memory test system</title><source>esp@cenet</source><creator>JOE, IN-SUNG ; KIM, YOUNG-KUM ; HA, KYOUNG-HO ; SONG, KI-JAE ; SUH, SUNG-DONG ; CHO, SOO-HAENG ; KIM, SEONG-GU</creator><creatorcontrib>JOE, IN-SUNG ; KIM, YOUNG-KUM ; HA, KYOUNG-HO ; SONG, KI-JAE ; SUH, SUNG-DONG ; CHO, SOO-HAENG ; KIM, SEONG-GU</creatorcontrib><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC ; GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS ; INFORMATION STORAGE ; PHYSICS ; SEMICONDUCTOR DEVICES ; STATIC STORES ; TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION ; TECHNICAL SUBJECTS COVERED BY FORMER USPC ; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20151011&DB=EPODOC&CC=TW&NR=I503830B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20151011&DB=EPODOC&CC=TW&NR=I503830B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JOE, IN-SUNG</creatorcontrib><creatorcontrib>KIM, YOUNG-KUM</creatorcontrib><creatorcontrib>HA, KYOUNG-HO</creatorcontrib><creatorcontrib>SONG, KI-JAE</creatorcontrib><creatorcontrib>SUH, SUNG-DONG</creatorcontrib><creatorcontrib>CHO, SOO-HAENG</creatorcontrib><creatorcontrib>KIM, SEONG-GU</creatorcontrib><title>Memory system, memory test system and method of testing memory system and memory test system</title><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC</subject><subject>GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS</subject><subject>INFORMATION STORAGE</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>STATIC STORES</subject><subject>TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION</subject><subject>TECHNICAL SUBJECTS COVERED BY FORMER USPC</subject><subject>TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZIjxTc3NL6pUKK4sLknN1VHIhXBLUotLoGIKiXkpQOGSjPwUhfw0sExmXjpMIYoadK08DKxpiTnFqbxQmptBwc01xNlDN7UgPz61uCAxOTUvtSQ-JNzT1MDYwtjAycmYCCUAfOE8UQ</recordid><startdate>20151011</startdate><enddate>20151011</enddate><creator>JOE, IN-SUNG</creator><creator>KIM, YOUNG-KUM</creator><creator>HA, KYOUNG-HO</creator><creator>SONG, KI-JAE</creator><creator>SUH, SUNG-DONG</creator><creator>CHO, SOO-HAENG</creator><creator>KIM, SEONG-GU</creator><scope>EVB</scope></search><sort><creationdate>20151011</creationdate><title>Memory system, memory test system and method of testing memory system and memory test system</title><author>JOE, IN-SUNG ; KIM, YOUNG-KUM ; HA, KYOUNG-HO ; SONG, KI-JAE ; SUH, SUNG-DONG ; CHO, SOO-HAENG ; KIM, SEONG-GU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TWI503830BB3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2015</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC</topic><topic>GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS</topic><topic>INFORMATION STORAGE</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>STATIC STORES</topic><topic>TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION</topic><topic>TECHNICAL SUBJECTS COVERED BY FORMER USPC</topic><topic>TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS</topic><toplevel>online_resources</toplevel><creatorcontrib>JOE, IN-SUNG</creatorcontrib><creatorcontrib>KIM, YOUNG-KUM</creatorcontrib><creatorcontrib>HA, KYOUNG-HO</creatorcontrib><creatorcontrib>SONG, KI-JAE</creatorcontrib><creatorcontrib>SUH, SUNG-DONG</creatorcontrib><creatorcontrib>CHO, SOO-HAENG</creatorcontrib><creatorcontrib>KIM, SEONG-GU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JOE, IN-SUNG</au><au>KIM, YOUNG-KUM</au><au>HA, KYOUNG-HO</au><au>SONG, KI-JAE</au><au>SUH, SUNG-DONG</au><au>CHO, SOO-HAENG</au><au>KIM, SEONG-GU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Memory system, memory test system and method of testing memory system and memory test system</title><date>2015-10-11</date><risdate>2015</risdate><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
| recordid | cdi_epo_espacenet_TWI503830BB |
| source | esp@cenet |
| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS INFORMATION STORAGE PHYSICS SEMICONDUCTOR DEVICES STATIC STORES TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION TECHNICAL SUBJECTS COVERED BY FORMER USPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS |
| title | Memory system, memory test system and method of testing memory system and memory test system |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-30T08%3A23%3A52IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=JOE,%20IN-SUNG&rft.date=2015-10-11&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ETWI503830BB%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |