Memory system, memory test system and method of testing memory system and memory test system

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Bibliographische Detailangaben
Hauptverfasser:	JOE, IN-SUNG, KIM, YOUNG-KUM, HA, KYOUNG-HO, SONG, KI-JAE, SUH, SUNG-DONG, CHO, SOO-HAENG, KIM, SEONG-GU
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS INFORMATION STORAGE PHYSICS SEMICONDUCTOR DEVICES STATIC STORES TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION TECHNICAL SUBJECTS COVERED BY FORMER USPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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