Slurry for mechanical polishing (cmp) of metals and use thereof

PURPOSE: Slurry compositions that are useful for polishing or planarizing a surface are provided, and polishing processes employing the compositions are provided. CONSTITUTION: The slurry composition comprises about 0.5 to about 6% by weight of the abrasive particles, about 1 to 50 g/l of the oxidiz...

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Hauptverfasser: LOFARO, MICHAEL FRANCIS, HANNAH, JAMES WILLARD, COTE, WILLIAM, TORNELLO, JAMES ANTHONY, DAVIS, KENNETH MORGAN, WHITE, ERIC JEFFREY, COBB, MICHAEL ADDITION, SCHAFFER, DEAN ALLEN, ESTES, SCOTT ALAN, KRISHNAN, MAHADEVAIYER, SLUSSER, GEORGE JAMES, CANAPERI, DONALD FRANCIS, BRIGHAM, MICHAEL TODD, GORDON, EDWARD JACK, MACDONALD, MICHAEL JOSEPH
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creator LOFARO, MICHAEL FRANCIS
HANNAH, JAMES WILLARD
COTE, WILLIAM
TORNELLO, JAMES ANTHONY
DAVIS, KENNETH MORGAN
WHITE, ERIC JEFFREY
COBB, MICHAEL ADDITION
SCHAFFER, DEAN ALLEN
ESTES, SCOTT ALAN
KRISHNAN, MAHADEVAIYER
SLUSSER, GEORGE JAMES
CANAPERI, DONALD FRANCIS
BRIGHAM, MICHAEL TODD
GORDON, EDWARD JACK
MACDONALD, MICHAEL JOSEPH
description PURPOSE: Slurry compositions that are useful for polishing or planarizing a surface are provided, and polishing processes employing the compositions are provided. CONSTITUTION: The slurry composition comprises about 0.5 to about 6% by weight of the abrasive particles, about 1 to 50 g/l of the oxidizer, about 0.1 to about 100 ml/l of the surface active agent, about 0.001 to about 20 g/l of the chloride ion source, and about 0.001 to about 20 g/l of the sulfate ion source. The method for polishing a surface comprises the steps of providing on the surface a slurry composition comprising abrasive particles, an oxidizer, a surface active agent, a chloride ion source and a sulfate ion source; and polishing the surface by contacting it with a polishing pad, wherein the surface is selected from the group consisting of copper, aluminum, tungsten, and their alloys.
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CONSTITUTION: The slurry composition comprises about 0.5 to about 6% by weight of the abrasive particles, about 1 to 50 g/l of the oxidizer, about 0.1 to about 100 ml/l of the surface active agent, about 0.001 to about 20 g/l of the chloride ion source, and about 0.001 to about 20 g/l of the sulfate ion source. The method for polishing a surface comprises the steps of providing on the surface a slurry composition comprising abrasive particles, an oxidizer, a surface active agent, a chloride ion source and a sulfate ion source; and polishing the surface by contacting it with a polishing pad, wherein the surface is selected from the group consisting of copper, aluminum, tungsten, and their alloys.</description><language>chi ; eng</language><subject>ADHESIVES ; ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES ; BASIC ELECTRIC ELEMENTS ; CANDLES ; CHEMISTRY ; DETERGENT COMPOSITIONS ; DETERGENTS ; DYES ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; FATTY ACIDS THEREFROM ; MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FORELSEWHERE ; METALLURGY ; MISCELLANEOUS APPLICATIONS OF MATERIALS ; MISCELLANEOUS COMPOSITIONS ; NATURAL RESINS ; PAINTS ; POLISHES ; POLISHING COMPOSITIONS OTHER THAN FRENCH POLISH ; RECOVERY OF GLYCEROL ; RESIN SOAPS ; SEMICONDUCTOR DEVICES ; SKI WAXES ; SOAP OR SOAP-MAKING ; USE OF SINGLE SUBSTANCES AS DETERGENTS</subject><creationdate>2009</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20090301&amp;DB=EPODOC&amp;CC=TW&amp;NR=I306895B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20090301&amp;DB=EPODOC&amp;CC=TW&amp;NR=I306895B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LOFARO, MICHAEL FRANCIS</creatorcontrib><creatorcontrib>HANNAH, JAMES WILLARD</creatorcontrib><creatorcontrib>COTE, WILLIAM</creatorcontrib><creatorcontrib>TORNELLO, JAMES ANTHONY</creatorcontrib><creatorcontrib>DAVIS, KENNETH MORGAN</creatorcontrib><creatorcontrib>WHITE, ERIC JEFFREY</creatorcontrib><creatorcontrib>COBB, MICHAEL ADDITION</creatorcontrib><creatorcontrib>SCHAFFER, DEAN ALLEN</creatorcontrib><creatorcontrib>ESTES, SCOTT ALAN</creatorcontrib><creatorcontrib>KRISHNAN, MAHADEVAIYER</creatorcontrib><creatorcontrib>SLUSSER, GEORGE JAMES</creatorcontrib><creatorcontrib>CANAPERI, DONALD FRANCIS</creatorcontrib><creatorcontrib>BRIGHAM, MICHAEL TODD</creatorcontrib><creatorcontrib>GORDON, EDWARD JACK</creatorcontrib><creatorcontrib>MACDONALD, MICHAEL JOSEPH</creatorcontrib><title>Slurry for mechanical polishing (cmp) of metals and use thereof</title><description>PURPOSE: Slurry compositions that are useful for polishing or planarizing a surface are provided, and polishing processes employing the compositions are provided. CONSTITUTION: The slurry composition comprises about 0.5 to about 6% by weight of the abrasive particles, about 1 to 50 g/l of the oxidizer, about 0.1 to about 100 ml/l of the surface active agent, about 0.001 to about 20 g/l of the chloride ion source, and about 0.001 to about 20 g/l of the sulfate ion source. The method for polishing a surface comprises the steps of providing on the surface a slurry composition comprising abrasive particles, an oxidizer, a surface active agent, a chloride ion source and a sulfate ion source; and polishing the surface by contacting it with a polishing pad, wherein the surface is selected from the group consisting of copper, aluminum, tungsten, and their alloys.</description><subject>ADHESIVES</subject><subject>ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CANDLES</subject><subject>CHEMISTRY</subject><subject>DETERGENT COMPOSITIONS</subject><subject>DETERGENTS</subject><subject>DYES</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>FATTY ACIDS THEREFROM</subject><subject>MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FORELSEWHERE</subject><subject>METALLURGY</subject><subject>MISCELLANEOUS APPLICATIONS OF MATERIALS</subject><subject>MISCELLANEOUS COMPOSITIONS</subject><subject>NATURAL RESINS</subject><subject>PAINTS</subject><subject>POLISHES</subject><subject>POLISHING COMPOSITIONS OTHER THAN FRENCH POLISH</subject><subject>RECOVERY OF GLYCEROL</subject><subject>RESIN SOAPS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>SKI WAXES</subject><subject>SOAP OR SOAP-MAKING</subject><subject>USE OF SINGLE SUBSTANCES AS DETERGENTS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2009</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAPziktKqpUSMsvUshNTc5IzMtMTsxRKMjPySzOyMxLV9BIzi3QVMhPA8qWJOYUKyTmpSiUFqcqlGSkFqXmp_EwsKYBhVN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJfEi4p7GBmYWlqZOTMRFKAP9ZMHE</recordid><startdate>20090301</startdate><enddate>20090301</enddate><creator>LOFARO, MICHAEL FRANCIS</creator><creator>HANNAH, JAMES WILLARD</creator><creator>COTE, WILLIAM</creator><creator>TORNELLO, JAMES ANTHONY</creator><creator>DAVIS, KENNETH MORGAN</creator><creator>WHITE, ERIC JEFFREY</creator><creator>COBB, MICHAEL ADDITION</creator><creator>SCHAFFER, DEAN ALLEN</creator><creator>ESTES, SCOTT ALAN</creator><creator>KRISHNAN, MAHADEVAIYER</creator><creator>SLUSSER, GEORGE JAMES</creator><creator>CANAPERI, DONALD FRANCIS</creator><creator>BRIGHAM, MICHAEL TODD</creator><creator>GORDON, EDWARD JACK</creator><creator>MACDONALD, MICHAEL JOSEPH</creator><scope>EVB</scope></search><sort><creationdate>20090301</creationdate><title>Slurry for mechanical polishing (cmp) of metals and use thereof</title><author>LOFARO, MICHAEL FRANCIS ; HANNAH, JAMES WILLARD ; COTE, WILLIAM ; TORNELLO, JAMES ANTHONY ; DAVIS, KENNETH MORGAN ; WHITE, ERIC JEFFREY ; COBB, MICHAEL ADDITION ; SCHAFFER, DEAN ALLEN ; ESTES, SCOTT ALAN ; KRISHNAN, MAHADEVAIYER ; SLUSSER, GEORGE JAMES ; CANAPERI, DONALD FRANCIS ; BRIGHAM, MICHAEL TODD ; GORDON, EDWARD JACK ; MACDONALD, MICHAEL JOSEPH</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TWI306895BB3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2009</creationdate><topic>ADHESIVES</topic><topic>ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CANDLES</topic><topic>CHEMISTRY</topic><topic>DETERGENT COMPOSITIONS</topic><topic>DETERGENTS</topic><topic>DYES</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>FATTY ACIDS THEREFROM</topic><topic>MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FORELSEWHERE</topic><topic>METALLURGY</topic><topic>MISCELLANEOUS APPLICATIONS OF MATERIALS</topic><topic>MISCELLANEOUS COMPOSITIONS</topic><topic>NATURAL RESINS</topic><topic>PAINTS</topic><topic>POLISHES</topic><topic>POLISHING COMPOSITIONS OTHER THAN FRENCH POLISH</topic><topic>RECOVERY OF GLYCEROL</topic><topic>RESIN SOAPS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>SKI WAXES</topic><topic>SOAP OR SOAP-MAKING</topic><topic>USE OF SINGLE SUBSTANCES AS DETERGENTS</topic><toplevel>online_resources</toplevel><creatorcontrib>LOFARO, MICHAEL FRANCIS</creatorcontrib><creatorcontrib>HANNAH, JAMES WILLARD</creatorcontrib><creatorcontrib>COTE, WILLIAM</creatorcontrib><creatorcontrib>TORNELLO, JAMES ANTHONY</creatorcontrib><creatorcontrib>DAVIS, KENNETH MORGAN</creatorcontrib><creatorcontrib>WHITE, ERIC JEFFREY</creatorcontrib><creatorcontrib>COBB, MICHAEL ADDITION</creatorcontrib><creatorcontrib>SCHAFFER, DEAN ALLEN</creatorcontrib><creatorcontrib>ESTES, SCOTT ALAN</creatorcontrib><creatorcontrib>KRISHNAN, MAHADEVAIYER</creatorcontrib><creatorcontrib>SLUSSER, GEORGE JAMES</creatorcontrib><creatorcontrib>CANAPERI, DONALD FRANCIS</creatorcontrib><creatorcontrib>BRIGHAM, MICHAEL TODD</creatorcontrib><creatorcontrib>GORDON, EDWARD JACK</creatorcontrib><creatorcontrib>MACDONALD, MICHAEL JOSEPH</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LOFARO, MICHAEL FRANCIS</au><au>HANNAH, JAMES WILLARD</au><au>COTE, WILLIAM</au><au>TORNELLO, JAMES ANTHONY</au><au>DAVIS, KENNETH MORGAN</au><au>WHITE, ERIC JEFFREY</au><au>COBB, MICHAEL ADDITION</au><au>SCHAFFER, DEAN ALLEN</au><au>ESTES, SCOTT ALAN</au><au>KRISHNAN, MAHADEVAIYER</au><au>SLUSSER, GEORGE JAMES</au><au>CANAPERI, DONALD FRANCIS</au><au>BRIGHAM, MICHAEL TODD</au><au>GORDON, EDWARD JACK</au><au>MACDONALD, MICHAEL JOSEPH</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Slurry for mechanical polishing (cmp) of metals and use thereof</title><date>2009-03-01</date><risdate>2009</risdate><abstract>PURPOSE: Slurry compositions that are useful for polishing or planarizing a surface are provided, and polishing processes employing the compositions are provided. CONSTITUTION: The slurry composition comprises about 0.5 to about 6% by weight of the abrasive particles, about 1 to 50 g/l of the oxidizer, about 0.1 to about 100 ml/l of the surface active agent, about 0.001 to about 20 g/l of the chloride ion source, and about 0.001 to about 20 g/l of the sulfate ion source. The method for polishing a surface comprises the steps of providing on the surface a slurry composition comprising abrasive particles, an oxidizer, a surface active agent, a chloride ion source and a sulfate ion source; and polishing the surface by contacting it with a polishing pad, wherein the surface is selected from the group consisting of copper, aluminum, tungsten, and their alloys.</abstract><oa>free_for_read</oa></addata></record>
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subjects ADHESIVES
ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES
BASIC ELECTRIC ELEMENTS
CANDLES
CHEMISTRY
DETERGENT COMPOSITIONS
DETERGENTS
DYES
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
FATTY ACIDS THEREFROM
MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FORELSEWHERE
METALLURGY
MISCELLANEOUS APPLICATIONS OF MATERIALS
MISCELLANEOUS COMPOSITIONS
NATURAL RESINS
PAINTS
POLISHES
POLISHING COMPOSITIONS OTHER THAN FRENCH POLISH
RECOVERY OF GLYCEROL
RESIN SOAPS
SEMICONDUCTOR DEVICES
SKI WAXES
SOAP OR SOAP-MAKING
USE OF SINGLE SUBSTANCES AS DETERGENTS
title Slurry for mechanical polishing (cmp) of metals and use thereof
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