Semiconductor device and manufacturing method for the same

A semiconductor device according to the present invention comprises an electrode pad (2) electrically conducted to an electric circuit formed on an element-formed surface of a silicon wafer (4); a wiring pattern (5) re-wired by being electrically conducted to the electrode pad (2); and an oxide film...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SUMINOE, SHINJI, IWAZAKI, YOSHIHIDE, MORI, KATSUNOBU
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A semiconductor device according to the present invention comprises an electrode pad (2) electrically conducted to an electric circuit formed on an element-formed surface of a silicon wafer (4); a wiring pattern (5) re-wired by being electrically conducted to the electrode pad (2); and an oxide film (10) formed on a surface of the wiring pattern (5), the oxide film being formed by subjecting the wiring pattern (5) to oxidization. With the provision of oxide film (10), the semiconductor device prevents a decrease in reliability in terms of electric characteristic or the like, and also achieves reduction in fabrication cost compared to a conventional semiconductor device.