Apparatus and method for detecting defects in a multi-channel scan driver

A technique is described for detecting defects such as short circuits in a device such as a discrete pixel detector used in a digital x-ray system. The technique employs test circuits associated with each row driver of the detector. The test circuits are enabled by a test enable input signal, and th...

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1. Verfasser: BIELSKI, SCOTT A
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description A technique is described for detecting defects such as short circuits in a device such as a discrete pixel detector used in a digital x-ray system. The technique employs test circuits associated with each row driver of the detector. The test circuits are enabled by a test enable input signal, and the row driver sequentially enables the rows of the detector, along with the individual test circuits. In a test sequence, output signals from the row test circuits are monitored to identify whether a defect, such as a short circuit, is likely to exist in the row or row driver. The test circuitry adds only minimal area and complexity to the row driver function, providing a high degree of test coverage at a low cost, with minimal likelihood of test circuitry-induced failures.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TWI248327BB</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TWI248327BB</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TWI248327BB3</originalsourceid><addsrcrecordid>eNqNyrEOgjAQgOEuDgZ9h3sBFjDRVYgGdhJHcmmv0qRcm97h88vgAzj93_AfzXjPGQvqJoDsYCVdkgOfCjhSshr4vcvvEggMCOsWNdR2QWaKIBYZXAkfKidz8BiFzr9WBp6PqR9qymkmyWiJSefpNTaXW9tcu679Y_kCXLE0aQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Apparatus and method for detecting defects in a multi-channel scan driver</title><source>esp@cenet</source><creator>BIELSKI, SCOTT A</creator><creatorcontrib>BIELSKI, SCOTT A</creatorcontrib><description>A technique is described for detecting defects such as short circuits in a device such as a discrete pixel detector used in a digital x-ray system. The technique employs test circuits associated with each row driver of the detector. The test circuits are enabled by a test enable input signal, and the row driver sequentially enables the rows of the detector, along with the individual test circuits. In a test sequence, output signals from the row test circuits are monitored to identify whether a defect, such as a short circuit, is likely to exist in the row or row driver. The test circuitry adds only minimal area and complexity to the row driver function, providing a high degree of test coverage at a low cost, with minimal likelihood of test circuitry-induced failures.</description><edition>7</edition><language>eng</language><subject>ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; PICTORIAL COMMUNICATION, e.g. TELEVISION ; TESTING ; X-RAY TECHNIQUE</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20060121&amp;DB=EPODOC&amp;CC=TW&amp;NR=I248327B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25566,76549</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20060121&amp;DB=EPODOC&amp;CC=TW&amp;NR=I248327B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BIELSKI, SCOTT A</creatorcontrib><title>Apparatus and method for detecting defects in a multi-channel scan driver</title><description>A technique is described for detecting defects such as short circuits in a device such as a discrete pixel detector used in a digital x-ray system. The technique employs test circuits associated with each row driver of the detector. The test circuits are enabled by a test enable input signal, and the row driver sequentially enables the rows of the detector, along with the individual test circuits. In a test sequence, output signals from the row test circuits are monitored to identify whether a defect, such as a short circuit, is likely to exist in the row or row driver. The test circuitry adds only minimal area and complexity to the row driver function, providing a high degree of test coverage at a low cost, with minimal likelihood of test circuitry-induced failures.</description><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>PICTORIAL COMMUNICATION, e.g. TELEVISION</subject><subject>TESTING</subject><subject>X-RAY TECHNIQUE</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEOgjAQgOEuDgZ9h3sBFjDRVYgGdhJHcmmv0qRcm97h88vgAzj93_AfzXjPGQvqJoDsYCVdkgOfCjhSshr4vcvvEggMCOsWNdR2QWaKIBYZXAkfKidz8BiFzr9WBp6PqR9qymkmyWiJSefpNTaXW9tcu679Y_kCXLE0aQ</recordid><startdate>20060121</startdate><enddate>20060121</enddate><creator>BIELSKI, SCOTT A</creator><scope>EVB</scope></search><sort><creationdate>20060121</creationdate><title>Apparatus and method for detecting defects in a multi-channel scan driver</title><author>BIELSKI, SCOTT A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TWI248327BB3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2006</creationdate><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>PICTORIAL COMMUNICATION, e.g. TELEVISION</topic><topic>TESTING</topic><topic>X-RAY TECHNIQUE</topic><toplevel>online_resources</toplevel><creatorcontrib>BIELSKI, SCOTT A</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BIELSKI, SCOTT A</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Apparatus and method for detecting defects in a multi-channel scan driver</title><date>2006-01-21</date><risdate>2006</risdate><abstract>A technique is described for detecting defects such as short circuits in a device such as a discrete pixel detector used in a digital x-ray system. The technique employs test circuits associated with each row driver of the detector. The test circuits are enabled by a test enable input signal, and the row driver sequentially enables the rows of the detector, along with the individual test circuits. In a test sequence, output signals from the row test circuits are monitored to identify whether a defect, such as a short circuit, is likely to exist in the row or row driver. The test circuitry adds only minimal area and complexity to the row driver function, providing a high degree of test coverage at a low cost, with minimal likelihood of test circuitry-induced failures.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
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subjects ELECTRIC COMMUNICATION TECHNIQUE
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
PICTORIAL COMMUNICATION, e.g. TELEVISION
TESTING
X-RAY TECHNIQUE
title Apparatus and method for detecting defects in a multi-channel scan driver
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-18T04%3A27%3A58IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=BIELSKI,%20SCOTT%20A&rft.date=2006-01-21&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ETWI248327BB%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true