Method and device for the temperature control of surface temperatures of substrates in a CVD reactor
The present invention relates to a method for the temperature control of the surface temperatures of substrates which are located in a process chamber of a CVD reactor on substrate holders carried on dynamic gas cushions by a substrate holder carrier. In order to reduce or even out the temperature d...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | The present invention relates to a method for the temperature control of the surface temperatures of substrates which are located in a process chamber of a CVD reactor on substrate holders carried on dynamic gas cushions by a substrate holder carrier. In order to reduce or even out the temperature deviation, mean values are formed from the surface temperatures (T1-T5) which are measured in particular optically, and the heights of the gas cushions (8) are adjusted in such a way, through variation of the individually controlled gas streams which generate the gas cushions (8), that the deviations of the measured surface temperatures (T1-T5) from the mean value lie within a predetermined temperature window (TU, TL). |
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