Memory test method, information recording medium and semiconductor integrated circuit

The purpose of the present invention is to provide a kind of method capable of testing on-chip memory with excellent efficiency. The invented method for testing memory of semiconductor integrated circuit (IC) is provided with the followings: CPU (102), which has command queue; memories (107, 108); a...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	KAMEI, TATSUYA, TATEZAWA, KEN, TAMAKI, SANEAKI, II, HARUO, IDE, HISAYOSHI
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE PHYSICS STATIC STORES
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